Let us wish you a happy birthday!
Date of Birth
Please fill in a complete birthday Enter a valid birthday
×
New Approaches To Image Processing Based Failure Analysis Of Nano-Scale Ulsi Devices (Micro And Nano Technologies) By Zeev Zalevsky, Pavel Livshits, Eran Gur
574.00 EGP

New Approaches To Image Processing Based Failure Analysis Of Nano-Scale Ulsi Devices (Micro And Nano Technologies) By Zeev Zalevsky, Pavel Livshits, Eran Gur

Be the first to rate this product 

574.00 EGP 

  - You Save -574.00 EGP
All prices include VAT  Details
Category Type
Nanotechnology
ISBN
9780323241434
Author
Zeev Zalevsky, Pavel Livshits, Eran Gur
Publisher
Elsevier
Description:

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in ...

Ship to Cairo (Change city)
Delivered within Wednesday, Dec 18 - Friday, Dec 20 to Cairo
Only 1 left in stock!

Condition:
New
Sold by:
FirstEdition-1ED (88% Positive Rating)

PRODUCT INFORMATION

  •  

    Specifications

    Category Type
    Nanotechnology
    ISBN
    9780323241434
    Item EAN
    2724460395909
    People
    Author
    Zeev Zalevsky, Pavel Livshits, Eran Gur
    People
    Publisher
    Elsevier
    Category Type
    Nanotechnology
    ISBN
    9780323241434
    Item EAN
    2724460395909
    People
    Author
    Zeev Zalevsky, Pavel Livshits, Eran Gur
    People
    Publisher
    Elsevier
    Technical Information
    Binding
    Paperback
    Languages and countries
    Book Language
    English
    Read more
  •  

    Description:

    New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality

    New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise. This book presents novel "smart" image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization. It explains an approach for high-resolution imaging of advanced metallization for micro- and nanoelectronics. This approach obviates the time-consuming preparation and selection of microscope measurement and sample conditions, enabling not only better electron-microscopic resolution, but also more efficient testing and quality control. This in turn leads to productivity gains in design and development of nano-scale ULSI chips. The authors also present several approaches for super-resolving low-resolution images to improve failure analysis of microelectronic chips.

    • Author:Zeev Zalevsky, Pavel Livshits, Eran Gur:
    • Publisher:Elsevier
    • ISBN:9780323241434
 

Customer Reviews

0
No ratings yet
Be the first to rate this product
Rate this product:

Sponsored products for you

×

Please verify your mobile number to complete your checkout

We will send you an SMS containing a verification code. Please double check your mobile number and click on "Send Verification Code".

+ Edit