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Quantum Metrology, Imaging, and Communication by David S. Simon - Hardcover
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PRODUCT INFORMATION

  •  

    Specifications

    Category Type
    Metallurgy & Materials Science
    ISBN
    9783319465494
    Item EAN
    2724445784797
    People
    Author
    Various
    People
    Publisher
    Springer
    Category Type
    Metallurgy & Materials Science
    ISBN
    9783319465494
    Item EAN
    2724445784797
    People
    Author
    Various
    People
    Publisher
    Springer
    Technical Information
    Binding
    Hardcover
    Languages and countries
    Book Language
    English
    Read more
  •  

    Description:

    This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by

    This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

    Product Features:
    • Category Type: Metallurgy & Materials Science
    • Author: David S. Simon, Gregg Jaeger and Alexander V. Sergienko
    • ISBN: 9783319465494
    • Binding: Hardcover
    • Book Language: English
    • Publisher: Springer
    • Number of Pages: 273
    • Dimensions (HxWxD): 155 x 235 x 18 mm
    • Publication Year: 2016
    • Book Origin: Switzerland
    • Product Weight: 596 g
    • Series: Quantum Science And Technology
 

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